Artificial Intelligence and Machine Learning in Defense Applications II
Dijk, J. (Ed.) (2020). Artificial Intelligence and Machine Learning in Defense Applications II. Proceedings of SPIE, the International Society for Optical Engineering, 11543. SPIE: Washington. ISBN 9781510638990; e-ISBN 9781510639003.
Deel van: Proceedings of SPIE, the International Society for Optical Engineering. SPIE: Bellingham, WA. ISSN 0277-786X; e-ISSN 1996-756X, meer
